December 16, 2014
TOKYO – Dec. 16, 2014 – UL Japan, a subsidiary of UL (Underwriters Laboratories), announced the launch of its LTE-device verification and evaluation testing service, accredited by KDDI Corp., a leading communications carrier in Japan.
UL Japan, as a KDDI simulator accredited laboratory, started its evaluation testing service Sept. 8, for KDDI devices, including smartphones, modules and chipsets. This test evaluates connectivity between mobile devices and base stations using CDMA and LTE access services for third-generation mobile phones.
UL Japan, as Registered Certification Body under the Japanese Radio Law and Telecommunications Business Act, can now provide customers one-stop service supporting regulations from Japanese Radio Law, FCC/IC (the U.S. and Canada), R&TTE (Europe), any international radio regulations to 3GPP, CTIA, GCF and PTCRB through UL’s global network.
KDDI and UL Japan, Inc. signed the agreement Sept. 18 at UL Japan’s Shonan EMC Laboratory.
About UL Japan
UL Japan, a subsidiary of UL (Underwriters Laboratories) provides a wide range of conformity assessment services to assist manufacturers in producing products compliant with applicable safety requirements and in gaining quick access to markets worldwide. Our state-of-the-art laboratories are accredited or recognized by regulatory agencies and governments throughout the world, including the US, Canada, Australia and Japan.
About UL
UL is a premier global independent safety science company that has championed progress for 120 years. Its more than 10,000 professionals are guided by the UL mission to promote safe working and living environments for all people. UL uses research and standards to continually advance and meet ever-evolving safety needs. We partner with businesses, manufacturers, trade associations and international regulatory authorities to bring solutions to a more complex global supply chain. For more information about our certification, testing, inspection, advisory and education services, visit http://www.UL.com.
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